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	Rangarajan, Sampath     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Built-In Testing of Integrated Circuit Wafers Rangarajan S., Fussell D., Malek M. IEEE Transactions on Computers 39(2): 195-205, 1990.  Type: Article Assume that a wafer contains an array of identical integrated circuits, that a test can be applied to all of these in parallel, and that the test results for each IC can be compared. In the usual case a test is applied and the results ...... Mar 1 1991
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