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Random Pattern Testing Versus Deterministic Testing of RAMs
David R., Fuentes A., Courtois B. IEEE Transactions on Computers 38(5): 637-650, 1989. Type: Article
The testing of very large RAMs is difficult. Simple write-read sequences in each cell will not generally catch pattern errors and are useless in detecting neighborhood faults. Deterministic algorithms are available for the more general...
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Dec 1 1989
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