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	Fuentes, Antoine     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Random Pattern Testing Versus Deterministic Testing of RAMs David R., Fuentes A., Courtois B. IEEE Transactions on Computers 38(5): 637-650, 1989.  Type: Article The testing of very large RAMs is difficult. Simple write-read sequences in each cell will not generally catch pattern errors and are useless in detecting neighborhood faults. Deterministic algorithms are available for the more general...... Dec 1 1989
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