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Concurrent fault detection in microprogrammed control units
Iyengar V., Kinney L. IEEE Transactions on Computers 34(9): 810-821, 1985. Type: Article
This paper takes a novel approach to fault detection, advocating a “monitor” or shadowing process that can detect a certain class of defects in the monitored process. The errors detectable are those which cause a co...
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Jul 1 1986
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