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	Shi, Yiwen     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Using implications to choose tests through suspect fault identification Dworak J., Nepal K., Alves N., Shi Y., Imbriglia N., Bahar R. ACM Transactions on Design Automation of Electronic Systems 18(1): 1-19, 2012.  Type: Article Building upon previous work that used login implications to improve the reliability of digital circuits in detecting online faults, this paper adds diagnosis properties to help localize the portion of the circuit where the fault has oc...... Apr 25 2013
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