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Alves, Gustavo
Porto, Portugal
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  SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects
Xu Q., Zhang Y., Chakrabarty K.  ACM Transactions on Design Automation of Electronic Systems 14(1): 1-27, 2009. Type: Article

This paper addresses the problem of reducing the time spent on testing core-to-core interconnections, namely on the verification of signal-integrity faults, typically relevant in high-performance systems on chip (SOC). The review of the state of t...

Jun 4 2009  
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