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  Browse All Reviews > Hardware (B) > Register-Transfer-Level Implementation (B.5) > Reliability And Testing (B.5.3)
  Reliability And Testing (B.5.3) See Reviews  
Subject Descriptors:
Built-In Tests (1)
Redundant Design (1)
Test Generation (3)
Testability (1)
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Reviews about "Reliability And Testing (B.5.3)":
Efficient hardware checkpointing: concepts, overhead analysis, and implementation
Koch D., Haubelt C., Teich J.  Field programmable gate arrays (Proceedings of the 2007 ACM/SIGDA 15th International Symposium on Field Programmable Gate Arrays, Monterey, California,  Feb 18-20, 2007) 188-196, 2007. Type: Proceedings
Principles of verifiable RTL design
Bening L., Foster H.,  Kluwer Academic Publishers, Norwell, MA, 2001. 312 pp. Type: Book (9780792373681)
Computations over finite monoids and their test complexity
Becker B., Sparmann U.  Theoretical Computer Science 84(2): 225-250, 1991. Type: Article
Techniques for user testing of the 68882
Marshall M.  Microprocessors & Microsystems 13(6): 382-386, 1989. Type: Article
Accumulator compression testing
Saxena N., Robinson J.  IEEE Transactions on Computers 35(4): 317-321, 1986. Type: Article
Related Topics
B.5.3 Reliability And Testing
  - Performance And Reliability
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