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  Browse All Reviews > Hardware (B) > Logic Design (B.6) > Reliability And Testing (B.6.2)
  Reliability And Testing (B.6.2) See Reviews  
Subject Descriptors:
Built-In Tests (2)
Error-Checking (3)
Redundant Design (3)
Test Generation (8)
Testability (10)
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Reviews about "Reliability And Testing (B.6.2)":
Using implications to choose tests through suspect fault identification
Dworak J., Nepal K., Alves N., Shi Y., Imbriglia N., Bahar R.  ACM Transactions on Design Automation of Electronic Systems 18(1): 1-19, 2012. Type: Article
Efficient branch and bound search with application to computer-aided design
Chen X., Bushnell M.,  Kluwer Academic Publishers, Norwell, MA, 1996.Type: Book (9780792396734)
Accumulator-Based Compaction of Test Responses
Rajski J., Tyszer J.  IEEE Transactions on Computers 42(6): 643-650, 1993. Type: Article
Sequential logic testing and verification
Ghosh A., Devadas S., Newton A.,  Kluwer Academic Publishers, Norwell, MA, 1992.Type: Book (9780792391883)
On Computing Signal Probability and Detection Probability of Stuck-At Faults
Chakravarty S., Hunt H.  IEEE Transactions on Computers 39(11): 1369-1377, 1990. Type: Article
Design of High-Speed and Cost-Effective Self-Testing Checkers for Low-Cost Arithmetic Codes
Piestrak S.  IEEE Transactions on Computers 39(3): 360-374, 1990. Type: Article
Invariance of complexity measures for networks with unreliable gates
Pippenger N.  Journal of the ACM 36(3): 531-539, 1989. Type: Article
Related Topics
B.6.2 Reliability And Testing
  - Performance And Reliability
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