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  Browse All Reviews > Hardware (B) > Integrated Circuits (B.7) > Reliability And Testing (B.7.3)
  Reliability And Testing (B.7.3) See Reviews  
Subject Descriptors:
Built-In Tests (6)
Error-Checking (4)
Redundant Design (2)
Test Generation (9)
Testability (9)
Proper Nouns:
Whistle (1)
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Reviews about "Reliability And Testing (B.7.3)":
Parallel Signature Analysis Design with Bounds on Aliasing
Saxena N., McCluskey E.  IEEE Transactions on Computers 46(4): 425-438, 1997. Type: Article
AVPGEN--a test generator for architecture verification
Chandra A., Iyengar V., Jameson D., Jawalekar R., Nair I., Rosen B., Mullen M., Yoon J., Armoni R., Geist D., Wolfsthal Y.  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 3(2): 188-200, 1995. Type: Article
Fault covering problems in reconfigurable VLSI systems
Libeskind-Hadas R., Hasan N., Cong J., McKinley P., Liu C.,  Kluwer Academic Publishers, Norwell, MA, 1992.Type: Book (9780792392316)
Silicon compilation of hierarchical control sections with unified BIST testability
Nicolaidis M., Torki K., Jerraya A., Courtois B. (ed)  Microprocessors & Microsystems 15(5): 257-269, 1991. Type: Article
Built-In Testing of Integrated Circuit Wafers
Rangarajan S., Fussell D., Malek M.  IEEE Transactions on Computers 39(2): 195-205, 1990. Type: Article
Selecting test methodologies for PLAs and random logic modules in VLSI circuits--an expert systems approach
Bhawmik S., Narang V., Chaudhuri P.  Integration, the VLSI Journal 7(3): 267-281, 1989. Type: Article
Gentest: An Automatic Test-Generation System for Sequential Circuits
Cheng W., Chakraborty T.  Computer 22(4): 43-49, 1989. Type: Article
Related Topics
B.7.3 Reliability And Testing
  - Performance And Reliability
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