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  Browse All Reviews > Hardware (B) > Arithmetic And Logic Structures (B.2) > Reliability, Testing, And Fault-Tolerance (B.2.3)
  Reliability, Testing, And Fault-Tolerance (B.2.3) See Reviews  
Subject Descriptors:
Diagnostics (1)
Error-Checking (4)
Redundant Design (2)
Test Generation (1)
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Reviews about "Reliability, Testing, And Fault-Tolerance (B.2.3)":
RT level timing modeling for aging prediction
Koppaetzky N., Metzdorf M., Eilers R., Helms D., Nebel W.  DATE 2016 (Proceedings of the 2016 Conference on Design, Automation & Test in Europe, Dresden, Germany,  Mar 14-18, 2016) 297-300, 2016. Type: Proceedings
Testing Schemes for FIR Filter Structures
Mukherjee N., Rajski J., Tyszer J.  IEEE Transactions on Computers 50(7): 674-688, 2001. Type: Article
Reflections on the Pentium Division Bug
Blum M., Wasserman H.  IEEE Transactions on Computers 45(4): 385-393, 1996. Type: Article
Coding techniques in fault-tolerant, self-checking, and fail-safe circuits
Tohma Y.,  Prentice-Hall, Inc., Upper Saddle River, NJ, 1986.Type: Book (9789780133082302)
Related Topics
B.2.3 Reliability, Testing, And Fault-Tolerance
  - Performance And Reliability
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