Computing Reviews
Today's Issue Hot Topics Search Browse Recommended My Account Log In
Browse by topic Browse by titles Authors Reviewers Browse by issue Browse Help
Search
  Browse All Reviews > Hardware (B) > Arithmetic And Logic Structures (B.2) > Reliability, Testing, And Fault-Tolerance (B.2.3)
 
  Reliability, Testing, And Fault-Tolerance (B.2.3) See Reviews  
 
Subject Descriptors:
Diagnostics (1)
Error-Checking (4)
Redundant Design (2)
Test Generation (1)
 
Proper Nouns:
There are no proper nouns with reviews under B.2.3.
 
 
Reviews limited to:
 
 

Reviews about "Reliability, Testing, And Fault-Tolerance (B.2.3)":
RT level timing modeling for aging prediction
Koppaetzky N., Metzdorf M., Eilers R., Helms D., Nebel W.  DATE 2016 (Proceedings of the 2016 Conference on Design, Automation & Test in Europe, Dresden, Germany, Mar 14-18, 2016) 297-300, 2016.  Type: Proceedings
Testing Schemes for FIR Filter Structures
Mukherjee N., Rajski J., Tyszer J. IEEE Transactions on Computers 50(7): 674-688, 2001.  Type: Article
Reflections on the Pentium Division Bug
Blum M., Wasserman H. IEEE Transactions on Computers 45(4): 385-393, 1996.  Type: Article
Coding techniques in fault-tolerant, self-checking, and fail-safe circuits
Tohma Y., Prentice-Hall, Inc., Upper Saddle River, NJ, 1986.  Type: Book (9789780133082302)
Related Topics
B.2.3 Reliability, Testing, And Fault-Tolerance
  - Performance And Reliability
   
 
Send Your Comments
Contact Us
Reproduction in whole or in part without permission is prohibited.   Copyright 1999-2024 ThinkLoud®
Terms of Use
| Privacy Policy