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	Browse All Reviews > Hardware (B) > Memory Structures (B.3) > Reliability, Testing, And Fault-Tolerance (B.3.4) > Test Generation (B.3.4...)     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending     1-2 of 2 Reviews about "Test Generation (B.3.4...)": Date Reviewed   An overview of deterministic functional RAM chip testing Van de Goor A., Verruijt C. ACM Computing Surveys 22(1): 5-33, 1990.  Type: Article The authors present a detailed study of faults, fault modeling, and test algorithms for testing RAMs. They classify and map many physical faults in RAMs into functional fault models, then give a number of algorithms to test these fault... Apr 1 1991   Random Pattern Testing Versus Deterministic Testing of RAMs David R., Fuentes A., Courtois B. IEEE Transactions on Computers 38(5): 637-650, 1989.  Type: Article The testing of very large RAMs is difficult. Simple write-read sequences in each cell will not generally catch pattern errors and are useless in detecting neighborhood faults. Deterministic algorithms are available for the more general... Dec 1 1989
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