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  Browse All Reviews > Hardware (B) > Register-Transfer-Level Implementation (B.5) > Reliability And Testing (B.5.3) > Built-In Tests (B.5.3...)  
 
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  1-1 of 1 Reviews about "Built-In Tests (B.5.3...)": Date Reviewed
  Accumulator compression testing
Saxena N., Robinson J. IEEE Transactions on Computers 35(4): 317-321, 1986.  Type: Article

This correspondence presents a test data reduction technique called Accumulator Compression Testing (ACT). In brief, the accumulator syndrome is the sum of the partial syndromes of test results over time. This accumulator syndrome and ...

Dec 1 1986
 
 
 
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