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1-2 of 2 Reviews about "
Test Generation (B.5.3...)
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Date Reviewed
Computations over finite monoids and their test complexity
Becker B., Sparmann U. Theoretical Computer Science 84(2): 225-250, 1991. Type: Article
The authors consider the test pattern generation problem for circuits that compute expressions over free monoids. They study two computations, expression evaluation and parallel prefix computation. In both cases, the family of all fini...
Sep 1 1992
Techniques for user testing of the 68882
Marshall M. Microprocessors & Microsystems 13(6): 382-386, 1989. Type: Article
This short, clearly written paper describes how NCR Corporation developed a series of programs to test the Motorola 68882 floating-point coprocessor for Motorola’s 68020 and 68030 microprocessors. Integrated circuits are test...
Jun 1 1990
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