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  Browse All Reviews > Hardware (B) > Register-Transfer-Level Implementation (B.5) > Reliability And Testing (B.5.3) > Test Generation (B.5.3...)  
 
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  1-2 of 2 Reviews about "Test Generation (B.5.3...)": Date Reviewed
  Computations over finite monoids and their test complexity
Becker B., Sparmann U. Theoretical Computer Science 84(2): 225-250, 1991.  Type: Article

The authors consider the test pattern generation problem for circuits that compute expressions over free monoids. They study two computations, expression evaluation and parallel prefix computation. In both cases, the family of all fini...

Sep 1 1992
  Techniques for user testing of the 68882
Marshall M. Microprocessors & Microsystems 13(6): 382-386, 1989.  Type: Article

This short, clearly written paper describes how NCR Corporation developed a series of programs to test the Motorola 68882 floating-point coprocessor for Motorola’s 68020 and 68030 microprocessors. Integrated circuits are test...

Jun 1 1990
 
 
 
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