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	Browse All Reviews > Hardware (B) > Logic Design (B.6) > Reliability And Testing (B.6.2) > Built-In Tests (B.6.2...)     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending     1-1 of 1 Reviews about "Built-In Tests (B.6.2...)": Date Reviewed   Accumulator-Based Compaction of Test Responses Rajski J., Tyszer J. IEEE Transactions on Computers 42(6): 643-650, 1993.  Type: Article A technique of testing VLSI circuits using a signature method is described and analyzed. The technique is best suited for circuits that may have an adder available as part of the circuit. The basic idea is to use the adder as an accumu... Nov 1 1994
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