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1-1 of 1 Reviews about "
Built-In Tests (B.6.2...)
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Accumulator-Based Compaction of Test Responses
Rajski J., Tyszer J. IEEE Transactions on Computers 42(6): 643-650, 1993. Type: Article
A technique of testing VLSI circuits using a signature method is described and analyzed. The technique is best suited for circuits that may have an adder available as part of the circuit. The basic idea is to use the adder as an accumu...
Nov 1 1994
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