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  Browse All Reviews > Hardware (B) > Logic Design (B.6) > Reliability And Testing (B.6.2) > Test Generation (B.6.2...)  
 
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  1-1 of 1 Reviews about "Test Generation (B.6.2...)": Date Reviewed
  Efficient branch and bound search with application to computer-aided design
Chen X., Bushnell M., Kluwer Academic Publishers, Norwell, MA, 1996.  Type: Book (9780792396734)

Chen and Bushnell describe an improved branch-and-bound search method for logic justification, a problem in computer-aided design (CAD). The improvement arises from avoiding duplicate computations (without using search decision trees)....

Aug 1 1997
 
 
 
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