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Browse All Reviews > Hardware (B) > Logic Design (B.6) > Reliability And Testing (B.6.2) > Testability (B.6.2...)
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1-2 of 2
Reviews about "Testability (B.6.2...)":
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Logic testing and design for testability
Fujiwara H., MIT Press, Cambridge, MA, 1986. Type: Book (9789780262060967)
This text provides an excellent introduction to the problems of testing logic circuits. Written so as to be self-contained, it is usable both as a self-study guide for professionals and as a textbook for undergraduate and beginning gra...
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Mar 1 1988 |
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Logic testing and design for testability
Fujiwara H., Massachusetts Institute of Technology, Cambridge, MA, 1985. Type: Book (9789780262060967)
The testing of digital circuits has become more and more important as the complexity of digital systems has increased. Testing in the hardware world means verifying that a circuit has been manufactured properly. Checking that the desig...
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Jul 1 1986 |
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