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	Browse All Reviews > Hardware (B) > Integrated Circuits (B.7) > Reliability And Testing (B.7.3) > Built-In Tests (B.7.3...)     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending     1-3 of 3 Reviews about "Built-In Tests (B.7.3...)": Date Reviewed   Parallel Signature Analysis Design with Bounds on Aliasing Saxena N., McCluskey E. IEEE Transactions on Computers 46(4): 425-438, 1997.  Type: Article As chip densities increase, conventional methods of testing become more difficult. One way around this problem is to use the extra circuitry made available by including self-test logic on the chip. Typically, the self-test circuitry in... Nov 1 1997   Silicon compilation of hierarchical control sections with unified BIST testability Nicolaidis M., Torki K., Jerraya A., Courtois B. (ed) Microprocessors & Microsystems 15(5): 257-269, 1991.  Type: Article The fault testing of integrated circuits has been a prolific research field. One recently popular method is called BIST (built-in self-test). This paper describes an automatic synthesis tool that builds up the control section of a micr... Jun 1 1992   Built-in test for VLSI: pseudorandom techniques Bardell P., McAnney W., Savir J., Wiley-Interscience, New York, NY, 1987.  Type: Book (9789780471624639) This book is an outgrowth of the notes the authors developed for their tutorial on built-in test at the International Test Conference. It can serve as a handbook for experienced professional test engineers, an introduction for engineer... Aug 1 1988
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