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Modeling the effect of redundancy on yield and performance of VLSI systems
Koren I., Pradhan D. IEEE Transactions on Computers 36(3): 344-355, 1987. Type: Article
The problem of adequate yield in the production of VLSI devices is first considered. The authors then point out that, in the near future, a complete computing system on a single chip is to be expected. The number of elements required i...
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Aug 1 1988 |
