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	Browse All Reviews > Hardware (B) > Integrated Circuits (B.7) > Reliability And Testing (B.7.3) > Testability (B.7.3...)     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending     1-1 of 1 Reviews about "Testability (B.7.3...)": Date Reviewed   Pseudorandom testing Wagner K., Chin C., McCluskey E. IEEE Transactions on Computers 36(3): 332-343, 1987.  Type: Article Circuits designed using built-in self test (BIST) techniques often use a linear feedback shift register (LFSR) for pattern generation. This has been modeled as a random process, but a pseudorandom process (sampling without replacement)... Aug 1 1988
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