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	Browse All Reviews > Hardware (B) > Arithmetic And Logic Structures (B.2) > Reliability, Testing, And Fault-Tolerance (B.2.3) > Test Generation (B.2.3...)     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending     1-1 of 1 Reviews about "Test Generation (B.2.3...)": Date Reviewed   Testing Schemes for FIR Filter Structures Mukherjee N., Rajski J., Tyszer J. IEEE Transactions on Computers 50(7): 674-688, 2001.  Type: Article This is a very interesting research paper. The presentation is very formal, and some mathematical background is required to understand the results. It will be of interest to those involved in the theory and practice of testing, as wel... Jul 18 2002
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