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Coding techniques in fault-tolerant, self-checking, and fail-safe circuits
Tohma Y., Prentice-Hall, Inc., Upper Saddle River, NJ, 1986. Type: Book (9789780133082302) |
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With the increase in circuit complexity, research in testability and fault-tolerance of circuits has received renewed interest. This is documented by the two-volume survey of which the paper under review is the fifth chapter. This paper focuses on the application of coding techniques to render circuits fault-tolerant, self-checking, and even fail-safe. The major sections and their contents are (1) Introduction: A general summary. (2) Error detecting codes and their applications: A brief review of some types of error detecting codes, evaluation of multiple-error detectability for two types of codes, and examples using parity prediction. (3) Self-checking circuits: A formal definition of fault-security, self-testing, and self-checking, and examples of self-checking checkers. (4) Fault-tolerance in combinational circuits: Adders with parity check matrix and fault masking by retry in fault-monotonic circuits. (5) Fault-tolerance in sequential circuits: State realization of sequential machines and majority decoding of states, fault-tolerant counters, and excitations of J-K flip-flops. (6) Fault-tolerant asynchronous sequential circuits: State assignment and race avoidance, state separation, and fault-tolerant design. (7) Fail-safe sequential circuits: Delay and flip-flop models.
Before I started reading this paper--or rather the complete book to which it belongs--I expected to find an up-to-date and well-structured presentation of both the theoretical and practical aspects of this area; moreover, I expected to find clear indications of what the major open problems are. Given these expectations, the paper was disappointing at the first reading. It does not present a clearly structured theory. The notation and the mathematics are not as elegant as I would like them to be. Many of the definitions and results are somewhat ad hoc. There are hardly any true proofs, only a very large number of examples. Open problems are rarely mentioned. However, despite these shortcomings the paper serves an important purpose and deserves careful study. It is a very useful and up-to-date introduction to the area, which could serve well as the basis for part of a course or be given to students as introductory reading material. In fact, the detailed examples mentioned before, and a set of well-selected problems, turn out to be very helpful.
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Reviewer:
H. Jürgensen |
Review #: CR111155 |
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| Other reviews under "Reliability, Testing, And Fault-Tolerance": |
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RT level timing modeling for aging prediction
Koppaetzky N., Metzdorf M., Eilers R., Helms D., Nebel W. DATE 2016 (Proceedings of the 2016 Conference on Design, Automation & Test in Europe, Dresden, Germany, Mar 14-18, 2016)297-300, 2016. Type: Proceedings |
Sep 9 2016 |
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