In this interesting paper, Bhunia and Roy present a novel integrated method for fault detection and localization, using wavelet transform-based IDD waveform analysis. The authors demonstrate that the wavelet transform has better sensitivity in fault detection than pure spectral or time domain analysis of the IDD waveform. Higher sensitivity of fault detection can be useful for detecting faults, which can be masked by other IDD analysis techniques, and can therefore increase fault coverage. The method introduced by the authors also utilized the time domain information present in the wavelet coefficients to identify the faulty region.

There have been many investigations into fault detection, but there is no efficient method for fault localization by analyzing the IDD waveform. The authors present an integrated approach for fault detection and localization using the wavelet transform of the IDD signal. An overview of the wavelet transform is provided, an explanation of fault detection and localization using wavelet analysis is presented, and experimental results and some important issues about practical applications of the introduced method are discussed.