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Functional test generation using binary decision diagrams
Abadir M., Reghbati H. Computers and Mathematics with Applications 13(5-6): 413-430, 1987. Type: Article
Automatic test generators available today work at the logic gate level, with perhaps a few higher-level primitives such as flip-flops and counters included. It would be advantageous to offer automatic test generation for circuits descr...
Dec 1 1988
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