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Chaudhuri, Parimal
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Selecting test methodologies for PLAs and random logic modules in VLSI circuits--an expert systems approach
Bhawmik S., Narang V., Chaudhuri P. Integration, the VLSI Journal 7(3): 267-281, 1989. Type: Article
Design for testability (DFT) involves methods of designing circuits and systems to make the creation of tests for manufacturing defects easier. A wide range of DFT techniques exist. Each method involves certain costs in such terms as c...
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Aug 1 1990
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