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	Roy, Kaushik     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 2 of 2 reviews       Efficient testing of SRAM with optimized March sequences and a novel DFT technique for emerging failures due to process variations Chen Q., Mahmoodi H., Bhunia S., Roy K. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13(11): 1286-1295, 2005.  Type: Article Anyone interested in very large-scale integration (VLSI) circuit design, the effects of manufacturing process parameter variations, failure mechanisms in VLSI chips, fault modeling of chip failures, testing VLSI chips, design for test ...... Oct 13 2006     A novel wavelet transform-based transient current analysis for fault detection and localization Bhunia S., Roy K. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13(4): 503-507, 2005.  Type: Article In this interesting paper, Bhunia and Roy present a novel integrated method for fault detection and localization, using wavelet transform-based IDD waveform analysis. The authors demonstrate that the wavelet transform has better sensit...... Nov 29 2005
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