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	Narang, V     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Selecting test methodologies for PLAs and random logic modules in VLSI circuits--an expert systems approach Bhawmik S., Narang V., Chaudhuri P. Integration, the VLSI Journal 7(3): 267-281, 1989.  Type: Article Design for testability (DFT) involves methods of designing circuits and systems to make the creation of tests for manufacturing defects easier. A wide range of DFT techniques exist. Each method involves certain costs in such terms as c...... Aug 1 1990
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