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	Alzahrani, Ahmad     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Area-energy tradeoffs of logic wear-leveling for BTI-induced aging Ashraf R., Khoshavi N., Alzahrani A., DeMara R., Kiamehr S., Tahoori M.  CF 2016 (Proceedings of the ACM International Conference on Computing Frontiers, Como, Italy, May 16-19, 2016) 37-44, 2016.  Type: Proceedings As technology nodes are scaled down into the nanometer level, the reliability of the devices for an electronic chip becomes critical. Among various reliability threats, aging is one of the most prominent, as it introduces gradual param...... Oct 4 2016
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