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	Selecting test methodologies for PLAs and random logic modules in VLSI circuits--an expert systems approach Bhawmik S., Narang V., Chaudhuri P. Integration, the VLSI Journal7(3):267-281,1989.Type:Article                     To:   Your Colleague's E-mail:     From:   Your E-mail:     Subject: Reviews: Selecting test methodologies for PLAs and random logic modules in VLSI circuits—an expert systems approach     Message Body:
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