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	A novel wavelet transform-based transient current analysis for fault detection and localization Bhunia S., Roy K. IEEE Transactions on Very Large Scale Integration (VLSI) Systems13(4):503-507,2005.Type:Article                     To:   Your Colleague's E-mail:     From:   Your E-mail:     Subject: Reviews: A novel wavelet transform-based transient current analysis for fault detection and localization     Message Body:
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