Search
	Selecting test methodologies for PLAs and random logic modules in VLSI circuits--an expert systems approach Bhawmik S., Narang V., Chaudhuri P. Integration, the VLSI Journal7(3):267-281,1989.Type:Article     Published By: Elsevier Science Publishers B. V.       You can purchase an article without having a subscription.
	Reproduction in whole or in part without permission is prohibited.   Copyright 1999-2024 ThinkLoud® Terms of Use | Privacy Policy