Computing Reviews
Today's Issue Hot Topics Search Browse Recommended My Account Log In
Review Help
Search
Parallel thinning with two-subiteration algorithms
Guo Z., Hall R. Communications of the ACM32 (3):359-373,1989.Type:Article
Date Reviewed: Jan 1 1990

Thinning is an important preprocessing step for many image analysis operations. The goal of this paper is to present and evaluate two parallel thinning algorithms.

The authors define these algorithms over binary-valued images digitized in a rectangular tessellation, as two-subiteration algorithms restricted to 3 × 3 thinning operators. These two algorithms are compared with other two-subiteration algorithms and with a fully parallel thinner considered in the literature. The comparison criteria are (1) the minimum number of iterations necessary to reach the skeleton, (2) the minimum percentage of redundant pixels left in the skeleton, and (3) the satisfiability of the specific goals of any thinning algorithms extended in this paper for parallel thinners.

The first algorithm modifies the algorithms of Zhang and Suen [1] and Lü and Wang [2] in order to produce thin results and to preserve all connectivity properties. The second algorithm is defined on an image that is divided into two subfields in a checkerboard pattern; it is an adaptation of the classical thinning algorithm of Rosenfeld and Kak. It achieves the best overall parallel speed and minimizes the number of redundant pixels. For both algorithms, the connectivity properties of the image are proved in two appendices.

The reader needs no special background. The clarity and the complete presentation of the algorithm and their performance define this paper. All included references are good and recent.

Reviewer:  G. Albeanu Review #: CR113475
1) Zhang, T. Y. and Suen, C. Y.A fast parallel algorithm for thinning digital patterns. Commun. ACM 27, 3 (March 1984), 236–239.
2) Lu:9ar, H. E. and Wang, P. S. P.A comment on “A fast parallel algorithm for thinning digital patterns.” Commun. ACM 29, 3 (March 1986), 239–242.
Bookmark and Share
  Featured Reviewer  
 
Pattern Analysis (I.5.2 ... )
 
 
Computer Vision (I.5.4 ... )
 
Would you recommend this review?
yes
no
Other reviews under "Pattern Analysis": Date
Understanding data pattern processing
Inmon W., Osterfelt S., QED Information Sciences, Inc., Wellesley, MA, 1991. Type: Book (9780894353864)
Jun 1 1992
A variable window approach to early vision
Boykov Y., Veksler O., Zabith R. IEEE Transactions on Pattern Analysis and Machine Intelligence 20(12): 1283-1294, 1998. Type: Article
Oct 1 1999
Robust parameterized component analysis: theory and applications to 2D facial appearance models
De la Torre F., Black M. Computer Vision and Image Understanding 91(1/2): 53-71, 2003. Type: Article
Apr 5 2004
more...

E-Mail This Printer-Friendly
Send Your Comments
Contact Us
Reproduction in whole or in part without permission is prohibited.   Copyright 1999-2024 ThinkLoud®
Terms of Use
| Privacy Policy