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Optical shop testing (Wiley Series in Pure and Applied Optics)
Malacara D., Wiley-Interscience, 2007. 888 pp. Type: Book (9780471484042)
Date Reviewed: May 1 2008

The 18 contributed chapters of this work span the gamut of mathematical and physics theory and testing practice, concentrating on interferometry and advanced optical machine tests. This third edition also provides chapters on surface characteristics and optical wavefront properties. The book is a relevant and timely text that brings together practical tests and protocols from leading researchers that describe all the types of tests that are carried out today in optical shops on optical components and systems.

Chapter 1 presents Newton, Fizeau, and Haidinger interferometers (and is co-authored by the editor). The pupil size of the source and observer are considered. Other factors affecting measurement are suitable light sources and materials for optical flats. A simple procedure is designed for estimating peak errors. Various surfaces (spherical, aspheric, and opaque) are considered in turn. The coherence requirements for the light source to the Fizeau interferometer are met. Multiple beam setup and testing on parallel plates are among the advanced topics presented.

Chapter 2, written by the editor, is about the Twyman-Green interferometer. The first consideration is the required accuracy in the beam splitter plate, and the optical path difference introduced by the beam splitter plate. Cube beam splitters are presented as a variety, although, because plate beam splitters lack optical cement in the vicinity of the dielectric film, light energy transmissions are not reduced. As a consequence, plate beam splitters can withstand significantly higher levels of radiation without suffering damage. Uses of this interferometer, compensations of intrinsic aberrations, and special design considerations are some of the advanced topics also included.

Chapters 3 through 7 report on other interferometer technologies. Chapter 3 (co-authored by the editor) concentrates on common-path interferometers such as Burch and Fresnel zone plate interferometers. Zernike tests for this class of interferometers are developed, as well as the measurement of the optical transfer function. Chapter 4 discusses lateral shear interferometers and arrangements based on various types of interferometers (such as Jamin, Michelson, cyclic, and Mach-Zehnder) in collimated and convergent light, and those with lasers. Chapter 5 (written by the editor) describes radial (single-pass, double-pass, laser, and thick-lens), rotational (compensated and uncompensated), and reversal shear interferometers. Chapter 6 considers multiple-beam interferometers (with the effects of fringes), and chapter 7 covers multiple-pass interferometers.

Chapters 8 through 12 develop a number of tests for aberrations and optical patterns. Chapter 8 develops the Foucault, wire, and phase modulation tests. Chapter 9 reports on the Ronchi test. Chapter 10 discusses the Hartmann, Hartmann-Shack, and other screen tests. Chapter 11 analyzes star tests, and chapter 12 tests aspheric wavefronts and surfaces. Chapters 10 through 12 were contributed mainly by the editor. There are so many details presented in the 290 pages of these five chapters that they cannot be trivially summarized here. Readers of this review should understand that these chapters are comprehensive, and can be considered a manual on relevant optical tests.

The remaining six chapters (13 through 18) are written about a potpourri of topics. Chapter 13 investigates Zernike polynomial and wavefront fitting. Chapter 14 analyzes phase shifting interferometry. Chapter 15 reports on surface profilers and white light interferometry, among other topics. Chapter 16 discusses optical metrology of diffuse surfaces. Chapters 17 and 18 (by the editor) provide mathematical and physics-based analysis for lens characteristics and optical surfaces.

The editor, Daniel Malacara, is a professor at the Centro de Investigaciones en Optica, Mexico. Malacara is a fellow of the Optical Society of America and of SPIE, the International Society of Optical Engineering. He is a designer of optical instruments, and this text, now in its third edition, has been translated into several languages. This book is a major text in the field, and a must-read for academicians and engineers alike.

Reviewer:  R. Goldberg Review #: CR135543 (0902-0103)
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