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Strategies for electronics test
Pynn C., McGraw-Hill, Inc., New York, NY, 1986. Type: Book (9789780070509979)
Date Reviewed: Dec 1 1987

While primarily designed for electronics production engineers and managers, this book will be of interest to all who are involved with computers. There are two distinct parts to the work. The first, Chapters 1–6, shows how an effective test strategy can be developed; the second, Chapters 7–12, explains the hardware implications of various test methods.

The author is mainly concerned with printed circuit boards. He considers the faults that may be found on the original boards--mainly shorts and open circuits--and then develops an analysis of the faults that appear only after the board has been “stuffed” (i.e., populated with components).

Under test procedures, both normal testing and “burn-in” are covered; the material here is especially topical. For the uninitiated there is a glossary of technical terms. This is a valuable book that can be recommended.

Reviewer:  A. D. Booth Review #: CR111606
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