This is a nicely written piece surveying the literature in test generation techniques. The D-algorithm, a classical approach, is covered along with the new random testing and signature analysis techniques. A background in digital systems is necessary for the reader to appreciate the complexity of test generation. Readers familiar with digital system design can read this paper with ease.
There are a few typographical errors in the paper:
(1) P. 52, Fig. 1.5.1(b): No D value is being propagated.
(2) P. 69: The authors use M and italicized m for tree structures. What are these? How are they related to the tree structure? An example would be helpful.
(3) P. 72: The formula for L needs fixing. The authors propose that the answer for L is 3 × 2n, while their figures imply it is −3 × 2n.
(4) P. 85: Ref. REDD83: The word Test is printed as Est.
The references are quite good. An excellent source that is not mentioned is a book by Lala [1]. The paper serves its purpose of familiarizing the reader with all the techniques for general- and special-purpose circuitry. It is very suitable for students beginning graduate-level work.
