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  Browse All Reviews > Hardware (B)  
  Hardware (B) See Reviews  
 
B.0 General (71)
B.1 Control Structures And Microprogramming
  General (19)
  Control Design Styles (7)
  Control Structure Performance Analysis And Design Aids (5)
  Control Structure Reliability, Testing, And Fault-Tolerance (10)
  Microprogram Design Aids (2)
  Microcode Applications (5)
  Miscellaneous (1)
B.2 Arithmetic And Logic Structures
  General (21)
  Design Styles (19)
  Performance Analysis And Design Aids (4)
  Reliability, Testing, And Fault-Tolerance (2)
  High-Speed Arithmetic (13)
  Miscellaneous (2)
B.3 Memory Structures
  General (19)
  Semiconductor Memories (2)
  Design Styles (101)
  Performance Analysis And Design Aids (17)
  Reliability, Testing, And Fault-Tolerance (6)
  Miscellaneous (5)
B.4 Input/Output And Data Communications
  General (43)
  Data Communications Devices (36)
  Input/Output Devices (67)
  Interconnections (Subsystems) (3)
B.4 Input/Output And Data Communications (cont.)
  Performance Analysis And Design Aids (14)
  Reliability, Testing, And Fault-Tolerance (14)
  Miscellaneous (3)
B.5 Register-Transfer-Level Implementation
  General (12)
  Design (14)
  Design Aids (8)
  Reliability And Testing (3)
  Miscellaneous (2)
B.6 Logic Design
  General (42)
  Design Styles (7)
  Reliability And Testing (5)
  Design Aids (2)
  Miscellaneous (5)
B.7 Integrated Circuits
  General (61)
  Types And Design Styles (172)
  Design Aids (5)
  Reliability And Testing (17)
  Miscellaneous (19)
B.8 Performance And Reliability
  General (26)
  Reliability, Testing, And Fault-Tolerance (59)
  Performance Analysis And Design Aids (58)
  Miscellaneous (0)
B.m Miscellaneous (19)
 
         
 
Reviews limited to:
 
 

Reviews in category "Hardware (B)":
The application of FPGA-based discrete wavelet transform system in EEG analysis
Li N., Nie Y., Zhu W.  ISDEA 2012 (Proceedings of the 2012 2nd International Conference on Intelligent System Design and Engineering Application, Jan 6-7, 2012) 1306-1309, 2012. Type: Proceedings
Using implications to choose tests through suspect fault identification
Dworak J., Nepal K., Alves N., Shi Y., Imbriglia N., Bahar R.  ACM Transactions on Design Automation of Electronic Systems 18(1): 1-19, 2012. Type: Article
Cross-VM side channels and their use to extract private keys
Zhang Y., Juels A., Reiter M., Ristenpart T.  CCS 2012 (Proceedings of the 2012 ACM Conference on Computer and Communications Security, Raleigh, NC,  Oct 16-18, 2012) 305-316, 2012. Type: Proceedings
Embedded systems for smart appliances and energy management
Grimm C., Neumann P., Mahlknecht S.,  Springer Publishing Company, Incorporated, New York, NY, 2012. 161 pp. Type: Book (978-1-441987-94-5)
Accuracy-configurable adder for approximate arithmetic designs
Kahng A., Kang S.  DAC 2012 (Proceedings of the 49th Annual Design Automation Conference, San Francisco, CA,  Jun 3-7, 2012) 820-825, 2012. Type: Proceedings
more...

Related Topics

B.1
Control Structures And Microprogramming
  - Language Classifications

B.1.3
Control Structure Reliability, Testing, And Fault-Tolerance
  - Performance And Reliability

B.1.4
Microprogram Design Aids
  - Language Classifications
  - Software/Program Verification
  - Design Tools and Techniques
  - Processors

B.2.1
Design Styles
  - Single Data Stream Architectures
  - Multiple Data Stream Architectures (Multiprocessors)

B.2.2
Performance Analysis And Design Aids
  - Performance And Reliability

B.2.3
Reliability, Testing, And Fault-Tolerance
  - Performance And Reliability

B.3.2
Design Styles
  - Storage Management

B.3.3
Performance Analysis And Design Aids
  - Performance And Reliability
  - Performance Of Systems

B.3.4
Reliability, Testing, And Fault-Tolerance
  - Performance And Reliability

B.4.4
Performance Analysis And Design Aids
  - Performance And Reliability

B.4.5
Reliability, Testing, And Fault-Tolerance
  - Performance And Reliability

B.5.3
Reliability And Testing
  - Performance And Reliability
  - Performance And Reliability
  - Performance And Reliability

B.8
Performance And Reliability
  - Performance Of Systems
   
 
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